Associations of excessive smartphone duration and unlock frequency with non-suicidal self-injury in college students

doi:10.5498/wjp.v16.i2.112817

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Feb 19, 2026 (publication date) through Feb 2, 2026

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World Journal of Psychiatry

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2220-3206

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Baishideng Publishing Group Inc, 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA

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World J Psychiatry. Feb 19, 2026; 16(2): 112817
Published online Feb 19, 2026. doi: 10.5498/wjp.v16.i2.112817

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Figure 1 Restricted cubic splines regression analysis between smartphone use and non-suicidal self-injury risk. A: Restricted cubic splines regression analysis between smartphone duration and non-suicidal self-injury risk; B: Restricted cubic splines regression analysis between smartphone unlock frequency and non-suicidal self-injury risk. Adjusted for gender, grade, race, registered permanent residence, siblings, parental educational attainment, current smoking, current drinking, physical activity, rational diet, family disasters, hospitalization experience, failed exams, and failed relationships. NSSI: Non-suicidal self-injury; OR: Odds ratio.

Citation: Yin J, Wang GD, Wu PX, Yang H, Liu ZS, Zhang YP. Associations of excessive smartphone duration and unlock frequency with non-suicidal self-injury in college students. World J Psychiatry 2026; 16(2): 112817
URL: https://www.wjgnet.com/2220-3206/full/v16/i2/112817.htm
DOI: https://dx.doi.org/10.5498/wjp.v16.i2.112817